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Materials Research Engineer -3252

NIST Professional Research Experience Program (PREP)
Email

Research Title:

Materials Research Engineer (CHIPS Project: Nondestructive defect detection metrology for advanced semiconductor packaging) PREP0003252

 

The work will entail: 

The candidate will join a multi-disciplinary team of scientists working to advance nondestructive defect detection metrology for advanced semiconductor packaging by developing reference artifacts and benchmark datasets data sets. The candidate will contribute with designing, fabricating, and characterizing the defect artifacts in the NIST NanoFab cleanroom or other facilities. The candidate will plan and conduct X-ray computed tomography (XCT) measurements to produce data sets of semiconductor samples with defects or the developed artifacts. The candidate will implement XCT reconstruction and defect detection algorithms on the data sets. The candidate is expected to prepare sample cross sections using mechanical polishing or focused ion beam for optical and scanning electron microscopy measurements. The candidate is also expected to contribute with XCT simulation approach to generate data sets with ground truth information. The incumbent takes resulting measurements and proceeds with image processing and analysis to extract meaningful information towards research goals described in the experiment plan. The incumbent organizes the measured and analyzed data sets for publication, communicates with the team, and disseminates the results at conferences and through publications.

 

Key responsibilities will include but are not limited to:

  • Make X-ray computed tomography measurements, reconstruction, and analysis. 
  • Characterize materials using optical or electron microscopy measurements.
  • Conduct X-ray computed tomography simulations.
  • Prepare data sets for publication. 
  • Presenting results at internal meetings, and occasional meetings with external stakeholders.
  • Publish results in journals and present results at conferences. 

 

Qualifications

  • PhD in physics, engineering, or a related field.
  • Experience with X-ray computed tomography measurement and analysis. 
  • Experience with scanning electron microscopy measurements.
  • Experience with focused ion beam-based characterization 
  • Experience with nanofabrication in clean room
  • Strong oral and written communication skills. 
  • Able to quickly learn and adapt to new fields or techniques 

 

To apply: 

  • If you are interested in one of these positions, please send an email with the subject "Job Enquiry PREP0003252" to GUNISTPREP@georgetown.edu, where PREP0003252 is the job number noted above.
  • Please send your CV and a short cover letter explaining your suitability for the position.
  • Please combine your documents into a single document in PDF format.

For the full job description:

https://georgetown.box.com/s/9wm649wcy12y22vmxl4fcbjuk2tbja95