Post Doc Research Associate - Quantum Materials Microscopy and Tomography

Job ID: 308260

Directorate: Energy and Environment

Division: Nuclear Science

Group: Nuclear Chemistry & Engineering

The successful candidate will utilize aberration-corrected scanning transmission electron microscopy (STEM) and atom probe tomography (APT) to examine III/V semiconductors for quantum materials systems. Approximately 50% of the candidate’s time will be spent preparing TEM samples, conducting atomic-resolution imaging and chemical analysis using STEM, energy-dispersive X-ray spectroscopy (EDS), and electron energy loss spectroscopy (EELS). The other 50% of the candidate’s time will be spent preparing APT specimens, APT experimental data collection, reconstruction, and detailed analysis, with the goal of generating complementary datasets. The candidate will be encouraged to propose, plan, and conduct their own related research. The candidate is also expected to have expert level proficiency in focused ion beam (FIB)-based site specific lift-out preparation of TEM and APT samples.

Minimum Qualifications:

Candidates must have received a PhD within the past five years (60 months) or within the next 8 months from an accredited college or university.

Preferred Qualifications:

• At least 3 years of experience in Scanning / Transmission Electron Microscopy.

• Strong oral and written communication skills.

• Ph.D. in Materials Science and/or Engineering or Physics.

• Candidates must have a strong background in their major field of study, the ability to work independently with little supervision, and an interest in working with others as part of an interdisciplinary team of researchers addressing challenges with national and international impact.

• Experience in TEM and/or APT sample preparation using FIB and/or mechanical polishing techniques.

• Experience in conducting atomic-resolution STEM imaging, EDS, and EELS spectroscopy of complex oxides or semiconductors.

• Experience in laser assisted and voltage APT experimental procedures, reconstruction of data using IVAS software and detailed APT data analysis.

• Experience with direct correlation of APT and STEM.

• Specific expertise on APT analysis of semiconductor devices and understanding of strategies to correct reconstruction artifacts and increase analysis yield.

• Familiarity with image simulation (multislice / Bloch wave) techniques for the interpretation of STEM images and spectroscopic data.

• Familiarity with image analysis tools (ImageJ, Matlab) and Python programming skills.